Abstract
Although there are quite a few approaches to Coverage Directed test Generation aided by Machine Learning which have been applied successfully to small and medium size digital designs, it is not clear how they would scale on more elaborate industrial-level designs. This paper evaluates one of these techniques, called MicroGP, on a fully fledged industrial design. The results indicate relative success evidenced by a good level of code coverage achieved with reasonably compact tests when compared to traditional test generation approaches. However, there is scope for improvement especially with respect to the diversity of the tests evolved.
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Ioannides, C., Barrett, G., Eder, K. (2011). Feedback-Based Coverage Directed Test Generation: An Industrial Evaluation. In: Barner, S., Harris, I., Kroening, D., Raz, O. (eds) Hardware and Software: Verification and Testing. HVC 2010. Lecture Notes in Computer Science, vol 6504. Springer, Berlin, Heidelberg. https://doi.org/10.1007/978-3-642-19583-9_13
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DOI: https://doi.org/10.1007/978-3-642-19583-9_13
Publisher Name: Springer, Berlin, Heidelberg
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