Abstract
Integrated-circuit producers are shoved by competitive pressure; new devices require increasingly complex verifications to be performed at increasing pace. This paper presents a methodology to automatically induce a test program for a microprocessor that maximizes a given verification metric. The methodology is based on an auto-adaptive evolutionary algorithm and exploits a syntactical description of microprocessor assembly language and an RT-level functional model. Experimental results clearly show the effectiveness of the approach. Comparisons reveal how auto-adaptive mechanisms dramatically enhance both performances and quality of the results.
This work has been partially supported by Intel Corporation through the grant “GP Based Test Program Generation”.
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© 2003 Springer-Verlag Berlin Heidelberg
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Corno, F., Cumani, F., Squillero, G. (2003). Exploiting Auto-adaptive μGP for Highly Effective Test Programs Generation. In: Tyrrell, A.M., Haddow, P.C., Torresen, J. (eds) Evolvable Systems: From Biology to Hardware. ICES 2003. Lecture Notes in Computer Science, vol 2606. Springer, Berlin, Heidelberg. https://doi.org/10.1007/3-540-36553-2_24
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DOI: https://doi.org/10.1007/3-540-36553-2_24
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