Automatic test generation for verifying microprocessors

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@Article{Corno:2005:ieeeP,

• author = "F. Corno and E. Sanchez and M. S. Reorda and G. Squillero",
• title = "Automatic test generation for verifying microprocessors",
• journal = "IEEE Potentials",
• year = "2005",
• volume = "24",
• number = "1",
• pages = "34--37",
• month = feb # "-" # mar,
• keywords = "genetic algorithms, genetic programming",
• ISSN = "0278-6648",
• DOI = "doi:10.1109/MP.2005.1405800",
• abstract = "A pipelined processor with a high-level behavioural HDL description is presented in this paper. It generates a set of effective test programs by using a simulator, which is able to evaluate with respect to an RTL coverage metric. The proposed optimiser is based on a technique called microGP, an evolutionary system able to automatically device and optimizes the program written in an assembly language. Quantitative coverage measurement presented will guide the test-program generation. The approach is fully automatic and broadly applicable. The minimal test set with the programmable coverage is attained.",

}

Genetic Programming entries for Fulvio Corno Ernesto Sanchez Matteo Sonza Reorda Giovanni Squillero

Citations