- author = "Damien Hogan and Tom Arbuckle and Conor Ryan",
- title = "How Early and with How Little Data? Using Genetic Programing to Evolve Endurance Classifiers for {MLC NAND} Flash Memory",
- booktitle = "Proceedings of the 16th European Conference on Genetic Programming, EuroGP 2013",
- year = "2013",
- month = "3-5 " # apr,
- editor = "Krzysztof Krawiec and Alberto Moraglio and Ting Hu and A. Sima Uyar and Bin Hu",
- series = "LNCS",
- volume = "7831",
- publisher = "Springer Verlag",
- address = "Vienna, Austria",
- pages = "253--264",
- organisation = "EvoStar",
- keywords = "genetic algorithms, genetic programming, Binary Classifier, Flash Memory",
- isbn13 = "978-3-642-37206-3",
-
DOI = "
doi:10.1007/978-3-642-37207-0_22",
- size = "12 pages",
-
abstract = "Despite having a multi-billion dollar market and many
operational advantages, Flash memory suffers from a
serious drawback, that is, the gradual degradation of
its storage locations through use. Manufacturers
currently have no method to predict how long they will
function correctly, resulting in extremely conservative
longevity specifications being placed on Flash
devices.
We leverage the fact that the durations of two crucial Flash operations, program and erase, change as the chips age. Their timings, recorded at intervals early in chips' working lifetimes, are used to predict whether storage locations will function correctly after given numbers of operations. We examine how early and with how little data such predictions can be made. Genetic Programming, employing the timings as inputs, is used to evolve binary classifiers that achieve up to a mean of 97.88percent correct classification. This technique displays huge potential for real-world application, with resulting savings for manufacturers.",
- notes = "Part of \cite{Krawiec:2013:GP} EuroGP'2013 held in conjunction with EvoCOP2013, EvoBIO2013, EvoMusArt2013 and EvoApplications2013",
