XCS with stack-based genetic programming

title = "{XCS} with stack-based genetic programming",

booktitle = "Proceedings of the 2003 Congress on Evolutionary Computation CEC2003",

editor = "Ruhul Sarker and Robert Reynolds and Hussein Abbass and Kay Chen Tan and Bob McKay and Daryl Essam and Tom Gedeon",

pages = "1186--1191",

year = "2003",

publisher = "IEEE Press",

address = "Canberra",

publisher_address = "445 Hoes Lane, P.O. Box 1331, Piscataway, NJ 08855-1331, USA",

month = "8-12 " # dec,

organisation = "IEEE Neural Network Council (NNC), Engineers Australia (IEAust), Evolutionary Programming Society (EPS), Institution of Electrical Engineers (IEE)",

keywords = "genetic algorithms, genetic programming, Artificial intelligence, Computer hacking, Genetic mutations, Intelligent robots, Laboratories, Learning automata, Proposals, System testing, data structures, knowledge based systems, learning (artificial intelligence), learning systems, linear programming, pattern classification, classifier condition representation, learning classifier system, linear programming, mutate classifier, reverse polish notation expression, stack-based genetic programming, virtual stack machine",

ISBN = "0-7803-7804-0",

URL = "

http://webspace.elet.polimi.it/lanzi/papers//lanzi2003cecstack.pdf",

DOI = "

doi:10.1109/CEC.2003.1299803",

abstract = "We present an extension of the learning classifier system XCS in which classifier conditions are represented by RPN expressions and stack-based Genetic Programming is used to recombine and mutate classifiers. In contrast with other extensions of XCS involving tree-based Genetic Programming, the representation we apply here produces conditions that are linear programs, interpreted by a virtual stack machine (similar to a pushdown automaton), and recombined through standard genetic operators. We test the version of XCS extended with stack-based conditions on a set of problems of different complexity.",

notes = "CEC 2003 - A joint meeting of the IEEE, the IEAust, the EPS, and the IEE.",