Put on Your Tester Hat: Improving programs for Automated Program Generation

Created by W.Langdon from gp-bibliography.bib Revision:1.8194

@InProceedings{Tan:2025:GI,

• author = "Shin Hwei Tan",
• title = "Put on Your Tester Hat: Improving programs for Automated Program Generation",
• booktitle = "14th International Workshop on Genetic Improvement @ICSE 2025",
• year = "2025",
• editor = "Aymeric Blot and Vesna Nowack and Penn Faulkner Rainford and Oliver Krauss",
• pages = "v",
• address = "Ottawa",
• month = "27 " # apr,
• publisher = "IEEE",
• note = "Invited Keynote",
• keywords = "genetic algorithms, genetic programming, Genetic Improvement, APR",
• URL = "http://gpbib.cs.ucl.ac.uk/gi2025/blot_2025_GI.pdf",
• size = "1 page",
• abstract = "Given either a specification written in natural language or an input program, automated program generation techniques produce a program according to the given specification or by modifying the input program. Automated program generation is a powerful technique that can be used for finding bugs in software systems that take programs as input or fixing bugs in the input programs. However, most existing techniques focus on automated program generation for automated program repair or program synthesis. This talk introduces a different perspective of automated program generation where we will discuss our latest results on automated program generation for testing static program analyzers by designing different types of program transformations. We will also explore and rethink about the automated program generation problem from the tester perspective. The new perspective could have huge potential for the design of new genetic improvement techniques to improve programs for automated program generation.",
• notes = "GI @ ICSE 2025, part of \cite{blot:2025:GI}",

}

Genetic Programming entries for Shin Hwei Tan

Citations